X-RAY Diffraction (XRD)

X-ray diffraction (XRD) is a powerful non-destructive analytical technique used to determine the crystal structure of materials. It operates on the principle of detecting diffraction patterns when X-rays are scattered by the atoms within a crystal lattice and relating these patterns to the different atomic planes within the crystal. XRD enables the identification and quantification of crystal structures using an extensive database. The technique is useful for assessing the crystallinity of polymers, identifying the type of crystalline fillers in a composite, and characterizing minerals and metals.