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Scanning Electron Microscopy (SEM)

  • Characterization

Brand

Quanta 3D FEG
Magnification
30x to 1.000.000x
Combined with
Energy Dispersive X-Ray (EDX) for elemental analysis.
Typical Sample size
<1 µm – 2 cm
Output
High resolution images
Present elements
SEM is scanning electron microscopy (SEM), a technique we use very often for research in our lab.
More equipment & Techniques

Polymer Technology Group Eindhoven BV
De Lismortel 31  |  5612 AR Eindhoven  |  P.O. Box 6284
5600 HG Eindhoven  |  The Netherlands
+31 (0) 40 751 76 76  |  info@ptgeindhoven.nl

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