Surface profiling (contact)

Brand

Bruker DektakXT Stylus profiler
Scan Length Range
55 mm or 200 mm with scan stitching capability
Vertical resolution
4 Å (@ 6.55 µm range)
Max sample dimensions
200x200x50 mm
Output
Two-dimensional surface profile measurements; Optional three-dimensional measurement/analyses

Surface profilers are commonly used for measuring thin film thickness, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
The tip of a stylus gently moves over the surface of a flat surface in one line, leading to a two-dimensional surface profile. When multiple lines next to each other are combined a three-dimensional plot can be derived and analyzed.

With the DektakXt we at PTG Eindhoven measure the thin film thickness, stress, surface roughness and form. If you would like to receive more information please feel free to contact us.