X-ray Photoelectron Spectroscopy (XPS)

Brand

Thermo Scientific K-Alpha
Characteristics
Analysis of top 0-10 nm of the surface
Equiped with depth profiling by means of argon ion sputtering and stage tilting
Specimen
Max. specimen size: Regular XPS 60 (w) x 60 (l) x 20 (d) mm; AR-XPS 8 (w) x 28 (l) x 5 (d) mm
Output
Elemental composition of surface
XPS X-Ray Photoelectron spectroscopy is a technique which can be used to measure elemental composition of a surface.