X-ray Photoelectron Spectroscopy (XPS)

Characterization

Brand

Thermo Scientific K-Alpha

X-Ray source

Al kα (1.486,67 eV)

Analyzer

180° Double-focusing hemispherical analyzer with a 128-channel detector

Elemental range

Lithium (Li) to uranium (U)

Resolution

0,1 – 1 at.% (depending on the element)

Specimen

Solid object 60 x 60 x 20 mm
Powder

Output

Elemental composition of surface Electronic state of surface atoms

XPS analysis is a non-destructive, surface-sensitive quantitative spectroscopic technique that typically measures the top 0-10 nm of a sample surface. Conducted under ultra-high vacuum, XPS is used to analyze the surface chemical composition, measuring both the elemental composition and the chemical states of atoms within the material. Besides single-point measurements, XPS allows for line profiling, mapping and depth profiling across the surface, providing detailed insights into the materials surface chemistry.