X-ray Photoelectron Spectroscopy (XPS)

Merk

Thermo Scientific K-Alpha

Characteristics

Analysis of top 0-10 nm of the surface
Equiped with depth profiling by means of argon ion sputtering and stage tilting

Specimen

Max. specimen size: Regular XPS 60 (w) x 60 (l) x 20 (d) mm; AR-XPS 8 (w) x 28 (l) x 5 (d) mm

Uitvoer

Elemental composition of surface